DFT (Design for Testability) Design
We offer DFT Design services to ensure your silicon is fully testable and production-ready. Our solutions minimize test costs and maximize fault coverage.
Our services ensure every chip is production-ready and fully testable, minimizing manufacturing costs while maximizing yield and fault coverage.
OUR DFT DESIGN EXPERTISE
- Scan Insertion: Inserting scan chains for efficient fault detection.
- ATPG (Automatic Test Pattern Generation): Generating high-coverage test vectors.
- BIST Implementation: Memory BIST (MBIST) and Logic BIST (LBIST) for built-in self-test capabilities.
- Boundary Scan (JTAG): IEEE 1149.1 compliant boundary scan design.
- Post-Silicon Debug: Validation and debug of silicon during bring-up.
- Tools / Technologies: Synopsys DFT Compiler, Cadence Modus, Tessent.